Noncontact on-wafer characterization of differential-mode millimeter- and submillimeter-wave devices and integrated circuits

dc.contributor.author	Caglayan, Cosan
dc.contributor.author	Sertel, Kubilay
dc.date.accessioned	2018-05-21T08:57:43Z
dc.date.available	2018-05-21T08:57:43Z
dc.date.issued	2016
dc.identifier.issn	0018-9480
dc.identifier.uri	http://hdl.handle.net/123456789/6171
dc.description	p.3911 - 3917	fr_FR
dc.language.iso	en	fr_FR
dc.relation.ispartofseries	in:IEEE Transactions on microwave theory and techniques, Vol.64, n°11 (part 2). (Nov. 2016);
dc.subject	Semiconducteurs	fr_FR
dc.subject	Circuits intégrés à très grande vitesse	fr_FR
dc.subject	Circuits intégrés	fr_FR
dc.subject	Symétriseurs millimètre : circuits intégrés	fr_FR
dc.title	Noncontact on-wafer characterization of differential-mode millimeter- and submillimeter-wave devices and integrated circuits	fr_FR
dc.type	Article	fr_FR