Avalanche microwave noise sources in commercial 90-nm CMOS technology

dc.contributor.author	Alimenti, Federico
dc.contributor.author	Tasselli, Gabriele
dc.contributor.author	Bott, Cyril
dc.date.accessioned	2019-01-09T09:55:08Z
dc.date.available	2019-01-09T09:55:08Z
dc.date.issued	2016-05
dc.identifier.issn	00189480
dc.identifier.uri	http://hdl.handle.net/123456789/6830
dc.description	p.1409 - 1418	en_US
dc.language.iso	en	en_US
dc.relation.ispartofseries	in:IEEE Transactions on Microwave theory and Techniques, Vol.64, n°5(Mai 2016);
dc.subject	Circuits CMOS	en_US
dc.subject	MOS complémentaires	en_US
dc.subject	Autotest intégré	en_US
dc.title	Avalanche microwave noise sources in commercial 90-nm CMOS technology	en_US
dc.type	Article	en_US