The Impact of Classifier Configuration and Classifier Combination on Bug Localization

Thomas, Stephen W.; Nagappan, Meiyappan; Blostein, Dorothea; Hassan, Ahmed E.

dc.contributor.author	Thomas, Stephen W.
dc.contributor.author	Nagappan, Meiyappan
dc.contributor.author	Blostein, Dorothea
dc.contributor.author	Hassan, Ahmed E.
dc.date.accessioned	2022-03-09T09:13:02Z
dc.date.available	2022-03-09T09:13:02Z
dc.date.issued	2013
dc.identifier.issn	0098-5589
dc.identifier.uri	http://repository.usthb.dz//xmlui/handle/123456789/9098
dc.description	1427-1443 p. ; 2.031ko.	en_US
dc.language.iso	en	en_US
dc.publisher	Institute of electrical and electronics engineers	en_US
dc.subject	Bogues (informatique)	en_US
dc.subject	Logiciels : Défauts de conception	en_US
dc.subject	Logiciels : Maintenance	en_US
dc.title	The Impact of Classifier Configuration and Classifier Combination on Bug Localization	en_US
dc.type	Article	en_US