The Risks of Coverage-Directed Test Case Generation

Gay, Gregory; Staats, Matt; Whalen, Michael; Heimdahl, Mats P. E.

dc.contributor.author	Gay, Gregory
dc.contributor.author	Staats, Matt
dc.contributor.author	Whalen, Michael
dc.contributor.author	Heimdahl, Mats P. E.
dc.date.accessioned	2022-03-24T09:39:22Z
dc.date.available	2022-03-24T09:39:22Z
dc.date.issued	2015
dc.identifier.issn	0098-5589
dc.identifier.uri	http://repository.usthb.dz//xmlui/handle/123456789/9148
dc.description	803-819 p. ; 332 ko.	en_US
dc.language.iso	en	en_US
dc.publisher	Institute of electrical and electronics engineers	en_US
dc.subject	Génie logiciel	en_US
dc.subject	Génération de tests automatisés	en_US
dc.subject	Oracle (système informatique)	en_US
dc.subject	Logiciel empirique	en_US
dc.subject	Logiciel automatisé	en_US
dc.title	The Risks of Coverage-Directed Test Case Generation	en_US
dc.type	Article	en_US