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dc.contributor.author |
Wong, W. Eric |
|
dc.contributor.author |
Gao, Ruizhi |
|
dc.contributor.author |
Li, Yihao |
|
dc.contributor.author |
Abreu, Rui |
|
dc.contributor.author |
Wotawa, Franz |
|
dc.date.accessioned |
2022-10-24T09:47:12Z |
|
dc.date.available |
2022-10-24T09:47:12Z |
|
dc.date.issued |
2016 |
|
dc.identifier.uri |
http://repository.usthb.dz//xmlui/handle/123456789/9244 |
|
dc.description |
707-740 p. ; 725ko. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Institute of electrical and electronics engineers |
en_US |
dc.relation.ispartofseries |
Institute of electrical and electronics engineers;vol.42-2016 |
|
dc.subject |
Génie logiciel |
en_US |
dc.subject |
Débogueurs |
en_US |
dc.subject |
Débogage de programme |
en_US |
dc.subject |
Localisation des défauts logiciels |
en_US |
dc.subject |
Tests logiciels |
en_US |
dc.subject |
Code suspect |
en_US |
dc.title |
A Survey on Software Fault Localization |
en_US |
dc.type |
Article |
en_US |
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