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dc.contributor.author |
Marchetto, Alessandro |
|
dc.contributor.author |
Islam, Md. Mahfuzul |
|
dc.contributor.author |
Asghar, Waseem |
|
dc.contributor.author |
Susi, Angelo |
|
dc.contributor.author |
Scanniello, Giuseppe |
|
dc.date.accessioned |
2022-10-26T09:15:59Z |
|
dc.date.available |
2022-10-26T09:15:59Z |
|
dc.date.issued |
2016 |
|
dc.identifier.uri |
http://repository.usthb.dz//xmlui/handle/123456789/9253 |
|
dc.description |
918-940 p. ;842ko. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Institute of electrical and electronics engineers |
en_US |
dc.relation.ispartofseries |
Institute of electrical and electronics engineers;vol.42-2016 |
|
dc.subject |
Code source |
en_US |
dc.subject |
Test multi-objectifs |
en_US |
dc.subject |
Artefacts |
en_US |
dc.subject |
Java : application |
en_US |
dc.subject |
Hiérarchisation des cas de test |
en_US |
dc.subject |
Tests de régression |
en_US |
dc.title |
A Multi-Objective Technique to Prioritize Test Cases |
en_US |
dc.type |
Article |
en_US |
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