Articles Électroniques
Permanent URI for this collectionhttp://192.168.16.104:4000/handle/123456789/8886
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Item A Survey on Metamorphic Testing(Institute of electrical and electronics engineers, 2016) Segura, Sergio; Fraser, Gordon; Sanchez, Ana B.; Ruiz-Cortés, AntonioItem Inferring Loop Invariants by Mutation, Dynamic Analysis, and Static Checking(Institute of electrical and electronics engineers, 2015) Galeotti, Juan P.; Furia, Carlo A.; May, Eva; Fraser, Gordon; Zeller, AndreasItem Whole Test Suite Generation(Institute of electrical and electronics engineers, 2013) Fraser, Gordon; Arcuri, Andrea