Articles Électroniques
Permanent URI for this collectionhttp://192.168.16.104:4000/handle/123456789/8886
Browse
6 results
Search Results
Item A Survey on Metamorphic Testing(Institute of electrical and electronics engineers, 2016) Segura, Sergio; Fraser, Gordon; Sanchez, Ana B.; Ruiz-Cortés, AntonioItem The Risks of Coverage-Directed Test Case Generation(Institute of electrical and electronics engineers, 2015) Gay, Gregory; Staats, Matt; Whalen, Michael; Heimdahl, Mats P. E.Item The Oracle Problem in Software Testing(Institute of electrical and electronics engineers, 2015) Barr, Earl T.; Harman, Mark; McMinn, Phil; Shahbaz, Muzammil; Yoo, ShinItem The Role of the Tester's Knowledge in Exploratory Software Testing(Institute of electrical and electronics engineers, 2013) Itkonen, Juha; Mantyla, Mika V.; Lassenius, CasperItem Automated Oracle Data Selection Support(Institute of electrical and electronics engineers, 2015) Gay, Gregory; Staats, Matt; Whalen, Michael; Heimdahl, Mats P. E.Item First, Debug the Test Oracle(Institute of electrical and electronics engineers, 2015) Guo, Xinrui; Zhou, Min; Song, Xiaoyu; Gu, Ming