Électronique et Électrotechnique
Permanent URI for this communityhttp://192.168.16.104:4000/handle/123456789/11
Browse
4 results
Search Results
Item Dynamic Testing for Deadlocks via Constraints(Institute of electrical and electronics engineers, 2016) Cai, Yan; Lu, QiongItem Where Should We Fix This Bug? : A Two-Phase Recommendation Model(Institute of electrical and electronics engineers, 2013) Kim, Dongsun; Tao, Yida; Kim, Sunghun; Zeller, AndreasItem The Impact of Classifier Configuration and Classifier Combination on Bug Localization(Institute of electrical and electronics engineers, 2013) Thomas, Stephen W.; Nagappan, Meiyappan; Blostein, Dorothea; Hassan, Ahmed E.Item Event Logs for the Analysis of Software Failures : A Rule-Based Approach(Institute of electrical and electronics engineers, 2013) Cinque, Marcello; Cotroneo, Domenico; Pecchia, Antonio