Électronique et Électrotechnique
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Item Dynamic Testing for Deadlocks via Constraints(Institute of electrical and electronics engineers, 2016) Cai, Yan; Lu, QiongItem The Impact of Classifier Configuration and Classifier Combination on Bug Localization(Institute of electrical and electronics engineers, 2013) Thomas, Stephen W.; Nagappan, Meiyappan; Blostein, Dorothea; Hassan, Ahmed E.Item Event Logs for the Analysis of Software Failures : A Rule-Based Approach(Institute of electrical and electronics engineers, 2013) Cinque, Marcello; Cotroneo, Domenico; Pecchia, Antonio