Électronique et Électrotechnique
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Item Assessing the Cost Effectiveness of Fault Prediction in Acceptance Testing(Institute of electrical and electronics engineers, 2013) Monden, Akito; Hayashi, Takuma; Shinoda, Shoji; Shirai, Kumiko; Yoshida, JunichiItem Local versus Global Lessons for Defect Prediction and Effort Estimation(Institute of electrical and electronics engineers, 2013) Menzies, Tim; Butcher, Andrew; Cok, David; Marcus, Andrian; Layman, LucasItem A Large-Scale Empirical Study of Just-in-Time Quality Assurance(Institute of electrical and electronics engineers, 2013) Kamei, Yasutaka; Shihab, Emad; Adams, Bram; Hassan, Ahmed E.; Mockus, AudrisItem Toward Comprehensible Software Fault Prediction Models Using Bayesian Network Classifiers(Institute of electrical and electronics engineers, 2013) Dejaeger, Karel; Verbraken, Thomas; Baesens, Bart