Comments on Researcher Bias : The Use of Machine Learning in Software Defect Prediction

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dc.contributor.author Tantithamthavorn, Chakkrit
dc.contributor.author McIntosh, Shane
dc.contributor.author Hassan, Ahmed E.
dc.contributor.author Matsumoto, Kenichi
dc.date.accessioned 2022-10-26T12:09:09Z
dc.date.available 2022-10-26T12:09:09Z
dc.date.issued 2016
dc.identifier.uri http://repository.usthb.dz//xmlui/handle/123456789/9262
dc.description 1092-1094 p. ; 140ko. en_US
dc.language.iso en en_US
dc.publisher Institute of electrical and electronics engineers en_US
dc.relation.ispartofseries Institute of electrical and electronics engineers;vol.42-2016
dc.subject Génie logiciel en_US
dc.subject Distribution de défauts logiciel en_US
dc.subject Assurance qualité des logiciels en_US
dc.subject Biais des chercheurs en_US
dc.subject Apprentissage automatique en_US
dc.title Comments on Researcher Bias : The Use of Machine Learning in Software Defect Prediction en_US
dc.type Article en_US


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