A Survey on Metamorphic Testing

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dc.contributor.authorSegura, Sergio
dc.contributor.authorFraser, Gordon
dc.contributor.authorSanchez, Ana B.
dc.contributor.authorRuiz-Cortés, Antonio
dc.date.accessioned2022-10-26T08:43:16Z
dc.date.available2022-10-26T08:43:16Z
dc.date.issued2016
dc.description805-824 p. ;1.155ko.en_US
dc.identifier.urihttp://repository.usthb.dz//xmlui/handle/123456789/9249
dc.language.isoenen_US
dc.publisherInstitute of electrical and electronics engineersen_US
dc.relation.ispartofseriesInstitute of electrical and electronics engineers;vol.42-2016
dc.subjectOracle (système informatique)en_US
dc.subjectEssais métamorphiquesen_US
dc.subjectEtudes empiriquesen_US
dc.titleA Survey on Metamorphic Testingen_US
dc.typeArticleen_US

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