Noncontact on-wafer characterization of differential-mode millimeter- and submillimeter-wave devices and integrated circuits

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dc.contributor.authorCaglayan, Cosan
dc.contributor.authorSertel, Kubilay
dc.date.accessioned2018-05-21T08:57:43Z
dc.date.available2018-05-21T08:57:43Z
dc.date.issued2016
dc.descriptionp.3911 - 3917fr_FR
dc.identifier.issn0018-9480
dc.identifier.urihttp://hdl.handle.net/123456789/6171
dc.language.isoenfr_FR
dc.relation.ispartofseriesin:IEEE Transactions on microwave theory and techniques, Vol.64, n°11 (part 2). (Nov. 2016);
dc.subjectSemiconducteursfr_FR
dc.subjectCircuits intégrés à très grande vitessefr_FR
dc.subjectCircuits intégrésfr_FR
dc.subjectSymétriseurs millimètre : circuits intégrésfr_FR
dc.titleNoncontact on-wafer characterization of differential-mode millimeter- and submillimeter-wave devices and integrated circuitsfr_FR
dc.typeArticlefr_FR

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