Dynamic Testing for Deadlocks via Constraints

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dc.contributor.authorCai, Yan
dc.contributor.authorLu, Qiong
dc.date.accessioned2022-10-26T08:48:51Z
dc.date.available2022-10-26T08:48:51Z
dc.date.issued2016
dc.description825-842 p. ; 2.044ko.en_US
dc.identifier.urihttp://repository.usthb.dz//xmlui/handle/123456789/9250
dc.language.isoenen_US
dc.publisherInstitute of electrical and electronics engineersen_US
dc.relation.ispartofseriesInstitute of electrical and electronics engineers;vol.42-2016
dc.subjectDétecteurs d’interblocageen_US
dc.subjectConLock : techniqueen_US
dc.subjectDéclenchement de blocageen_US
dc.subjectBogues (informatique)en_US
dc.subjectLogiciels : Défauts de conceptionen_US
dc.titleDynamic Testing for Deadlocks via Constraintsen_US
dc.typeArticleen_US

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