Local versus Global Lessons for Defect Prediction and Effort Estimation

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dc.contributor.authorMenzies, Tim
dc.contributor.authorButcher, Andrew
dc.contributor.authorCok, David
dc.contributor.authorMarcus, Andrian
dc.contributor.authorLayman, Lucas
dc.date.accessioned2022-03-02T09:49:35Z
dc.date.available2022-03-02T09:49:35Z
dc.date.issued2013
dc.description822-834 p. ; 2.280ko.en_US
dc.identifier.issn0098-5589
dc.identifier.urihttp://repository.usthb.dz//xmlui/handle/123456789/9059
dc.language.isoenen_US
dc.publisherInstitute of electrical and electronics engineersen_US
dc.subjectExploration de donnéesen_US
dc.subjectPrédictions conformes (informatique)en_US
dc.subjectROCESS : ingénierie logicielleen_US
dc.titleLocal versus Global Lessons for Defect Prediction and Effort Estimationen_US
dc.typeArticleen_US

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