Test Case Prioritization Using Lexicographical Ordering
dc.contributor.author | Eghbali, Sepehr | |
dc.contributor.author | Tahvildari, Ladan | |
dc.date.accessioned | 2022-10-26T12:28:07Z | |
dc.date.available | 2022-10-26T12:28:07Z | |
dc.date.issued | 2016 | |
dc.description | 1178-1195 p. ; 761ko. | en_US |
dc.identifier.uri | http://repository.usthb.dz//xmlui/handle/123456789/9267 | |
dc.language.iso | en | en_US |
dc.publisher | Institute of electrical and electronics engineers | en_US |
dc.relation.ispartofseries | Institute of electrical and electronics engineers;vol.42-2016 | |
dc.subject | Algorithme de priorisation itératif (gourmand) | en_US |
dc.subject | Détection des défauts | en_US |
dc.subject | Ordre lexicographique | en_US |
dc.subject | Tests de régression | en_US |
dc.subject | Hiérarchisation des cas de test | en_US |
dc.title | Test Case Prioritization Using Lexicographical Ordering | en_US |
dc.type | Article | en_US |