A Survey on Software Fault Localization

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dc.contributor.authorWong, W. Eric
dc.contributor.authorGao, Ruizhi
dc.contributor.authorLi, Yihao
dc.contributor.authorAbreu, Rui
dc.contributor.authorWotawa, Franz
dc.date.accessioned2022-10-24T09:47:12Z
dc.date.available2022-10-24T09:47:12Z
dc.date.issued2016
dc.description707-740 p. ; 725ko.en_US
dc.identifier.urihttp://repository.usthb.dz//xmlui/handle/123456789/9244
dc.language.isoenen_US
dc.publisherInstitute of electrical and electronics engineersen_US
dc.relation.ispartofseriesInstitute of electrical and electronics engineers;vol.42-2016
dc.subjectGénie logicielen_US
dc.subjectDébogueursen_US
dc.subjectDébogage de programmeen_US
dc.subjectLocalisation des défauts logicielsen_US
dc.subjectTests logicielsen_US
dc.subjectCode suspecten_US
dc.titleA Survey on Software Fault Localizationen_US
dc.typeArticleen_US

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