Caractérisation des couches minces à base de silicium amorphe hydrogéné
dc.contributor.author | Laidoudi, Lamia | |
dc.date.accessioned | 2015-11-12T13:26:33Z | |
dc.date.available | 2015-11-12T13:26:33Z | |
dc.date.issued | 2010 | |
dc.description | 72 p. : ill. ; 30 cm. (+ CD-Rom) | fr_FR |
dc.identifier.uri | http://hdl.handle.net/123456789/3936 | |
dc.language.iso | fr | fr_FR |
dc.subject | Couches minces | fr_FR |
dc.subject | Semiconducteurs amorphes | fr_FR |
dc.subject | Germanium | fr_FR |
dc.title | Caractérisation des couches minces à base de silicium amorphe hydrogéné | fr_FR |
dc.type | Thesis | fr_FR |
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