The Impact of Classifier Configuration and Classifier Combination on Bug Localization

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dc.contributor.authorThomas, Stephen W.
dc.contributor.authorNagappan, Meiyappan
dc.contributor.authorBlostein, Dorothea
dc.contributor.authorHassan, Ahmed E.
dc.date.accessioned2022-03-09T09:13:02Z
dc.date.available2022-03-09T09:13:02Z
dc.date.issued2013
dc.description1427-1443 p. ; 2.031ko.en_US
dc.identifier.issn0098-5589
dc.identifier.urihttp://repository.usthb.dz//xmlui/handle/123456789/9098
dc.language.isoenen_US
dc.publisherInstitute of electrical and electronics engineersen_US
dc.subjectBogues (informatique)en_US
dc.subjectLogiciels : Défauts de conceptionen_US
dc.subjectLogiciels : Maintenanceen_US
dc.titleThe Impact of Classifier Configuration and Classifier Combination on Bug Localizationen_US
dc.typeArticleen_US

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