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Home
Électronique et Électrotechnique
Articles Électroniques
Articles Électroniques
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http://192.168.16.104:4000/handle/123456789/8886
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search.filters.author.Hassan, Ahmed E.
1
search.filters.author.Matsumoto, Kenichi
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search.filters.author.McIntosh, Shane
1
search.filters.author.Tantithamthavorn, Chakkrit
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search.filters.subject.Assurance qualité des logiciels
1
search.filters.subject.Apprentissage automatique
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search.filters.subject.Biais des chercheurs
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search.filters.subject.Distribution de défauts logiciel
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search.filters.subject.Génie logiciel
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2016
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Comments on Researcher Bias : The Use of Machine Learning in Software Defect Prediction
(
Institute of electrical and electronics engineers
,
2016
)
Tantithamthavorn, Chakkrit
;
McIntosh, Shane
;
Hassan, Ahmed E.
;
Matsumoto, Kenichi
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