Articles Électroniques
Permanent URI for this collectionhttp://192.168.16.104:4000/handle/123456789/8886
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Item Comments on Researcher Bias : The Use of Machine Learning in Software Defect Prediction(Institute of electrical and electronics engineers, 2016) Tantithamthavorn, Chakkrit; McIntosh, Shane; Hassan, Ahmed E.; Matsumoto, KenichiItem A Large-Scale Empirical Study of Just-in-Time Quality Assurance(Institute of electrical and electronics engineers, 2013) Kamei, Yasutaka; Shihab, Emad; Adams, Bram; Hassan, Ahmed E.; Mockus, AudrisItem A Survey on Load Testing of Large-Scale Software Systems(Institute of electrical and electronics engineers, 2015) Jiang, Zhen Ming; Hassan, Ahmed E.