Articles Électroniques
Permanent URI for this collectionhttp://192.168.16.104:4000/handle/123456789/8886
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Item Developer Micro Interaction Metrics for Software Defect Prediction(Institute of electrical and electronics engineers, 2016) Lee, Taek; Nam, Jaechang; Han, Donggyun; Kim, Sunghun; In, Hoh PeterItem The Effect of GoF Design Patterns on Stability : A Case Study(Institute of electrical and electronics engineers, 2015) Ampatzoglou, Apostolos; Chatzigeorgiou, Alexander; Charalampidou, Sofia; Avgeriou, ParisItem Are Slice-Based Cohesion Metrics Actually Useful in Effort-Aware Post-Release Fault-Proneness Prediction? : An Empirical Study(Institute of electrical and electronics engineers, 2015) Yang, Yibiao; Zhou, Yuming; Lu, Hongmin; Chen, Lin; Chen, ZhenyuItem A Large-Scale Empirical Study of Just-in-Time Quality Assurance(Institute of electrical and electronics engineers, 2013) Kamei, Yasutaka; Shihab, Emad; Adams, Bram; Hassan, Ahmed E.; Mockus, AudrisItem Ranking and Clustering Software Cost Estimation Models through a Multiple Comparisons Algorithm(Institute of electrical and electronics engineers, 2013) Mittas, Nikolaos; Angelis, LefterisItem A Second Replicated Quantitative Analysis of Fault Distributions in Complex Software Systems(Institute of electrical and electronics engineers, 2013) Grbac, Tihana Galinac; Runeson, Per; Huljenic, DarkoItem Automated Oracle Data Selection Support(Institute of electrical and electronics engineers, 2015) Gay, Gregory; Staats, Matt; Whalen, Michael; Heimdahl, Mats P. E.Item Facilitating Coordination between Software Developers : A Study and Techniques for Timely and Efficient Recommendations(Institute of electrical and electronics engineers, 2015) Blincoe, Kelly; Valetto, Giuseppe; Damian, Daniela