Articles Électroniques
Permanent URI for this collectionhttp://192.168.16.104:4000/handle/123456789/8886
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Item Comments on Researcher Bias : The Use of Machine Learning in Software Defect Prediction(Institute of electrical and electronics engineers, 2016) Tantithamthavorn, Chakkrit; McIntosh, Shane; Hassan, Ahmed E.; Matsumoto, KenichiItem Where Should We Fix This Bug? : A Two-Phase Recommendation Model(Institute of electrical and electronics engineers, 2013) Kim, Dongsun; Tao, Yida; Kim, Sunghun; Zeller, AndreasItem A Learning-Based Framework for Engineering Feature-Oriented Self-Adaptive Software Systems(Institute of electrical and electronics engineers, 2013) Esfahani, Naeem; Elkhodary, Ahmed; Malek, SamItem Assessing the Cost Effectiveness of Fault Prediction in Acceptance Testing(Institute of electrical and electronics engineers, 2013) Monden, Akito; Hayashi, Takuma; Shinoda, Shoji; Shirai, Kumiko; Yoshida, JunichiItem Reducing Features to Improve Code Change-Based Bug Prediction(Institute of electrical and electronics engineers, 2013) Shivaji, Shivkumar; Whitehead Jr., E. James; Akella, Ram; Kim, SunghunItem A Machine Learning Approach to Software Requirements Prioritization(Institute of electrical and electronics engineers, 2013) Perini, Anna; Susi, Angelo; Avesani, PaoloItem GALE : Geometric Active Learning for Search-Based Software Engineering(Institute of electrical and electronics engineers, 2015) Krall, Joseph; Menzies, Tim; Davies, MistyItem Toward Comprehensible Software Fault Prediction Models Using Bayesian Network Classifiers(Institute of electrical and electronics engineers, 2013) Dejaeger, Karel; Verbraken, Thomas; Baesens, Bart