Dépôt et caractérisation du silicium en couches minces

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dc.contributor.authorCherfi, Rabah
dc.date.accessioned2016-12-18T12:14:37Z
dc.date.available2016-12-18T12:14:37Z
dc.date.issued2016
dc.description151 p. ill. ; 30 cm. (+ CD-Rom)fr_FR
dc.identifier.urihttp://hdl.handle.net/123456789/5107
dc.language.isofrfr_FR
dc.subjectSilicium cristalliséfr_FR
dc.subjectCouches mincesfr_FR
dc.subjectPulvérisationfr_FR
dc.subjectSemiconducteurs amorphesfr_FR
dc.titleDépôt et caractérisation du silicium en couches mincesfr_FR
dc.typeThesisfr_FR

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