Developer Micro Interaction Metrics for Software Defect Prediction

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dc.contributor.authorLee, Taek
dc.contributor.authorNam, Jaechang
dc.contributor.authorHan, Donggyun
dc.contributor.authorKim, Sunghun
dc.contributor.authorIn, Hoh Peter
dc.date.accessioned2022-10-26T09:38:13Z
dc.date.available2022-10-26T09:38:13Z
dc.date.issued2016
dc.description1015-1035 p. ; 1.551ko.en_US
dc.identifier.urihttp://repository.usthb.dz//xmlui/handle/123456789/9259
dc.language.isoenen_US
dc.publisherInstitute of electrical and electronics engineersen_US
dc.relation.ispartofseriesInstitute of electrical and electronics engineers;vol.42-2016
dc.subjectGénie logicielen_US
dc.subjectMétriques logiciellesen_US
dc.subjectDistribution de défauts logicielen_US
dc.subjectMétriques de micro-interactionen_US
dc.subjectInteraction avec les développeurs, Mylynen_US
dc.titleDeveloper Micro Interaction Metrics for Software Defect Predictionen_US
dc.typeArticleen_US

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