Comments on Researcher Bias : The Use of Machine Learning in Software Defect Prediction

Simple item page
dc.contributor.authorTantithamthavorn, Chakkrit
dc.contributor.authorMcIntosh, Shane
dc.contributor.authorHassan, Ahmed E.
dc.contributor.authorMatsumoto, Kenichi
dc.date.accessioned2022-10-26T12:09:09Z
dc.date.available2022-10-26T12:09:09Z
dc.date.issued2016
dc.description1092-1094 p. ; 140ko.en_US
dc.identifier.urihttp://repository.usthb.dz//xmlui/handle/123456789/9262
dc.language.isoenen_US
dc.publisherInstitute of electrical and electronics engineersen_US
dc.relation.ispartofseriesInstitute of electrical and electronics engineers;vol.42-2016
dc.subjectGénie logicielen_US
dc.subjectDistribution de défauts logicielen_US
dc.subjectAssurance qualité des logicielsen_US
dc.subjectBiais des chercheursen_US
dc.subjectApprentissage automatiqueen_US
dc.titleComments on Researcher Bias : The Use of Machine Learning in Software Defect Predictionen_US
dc.typeArticleen_US

Files

Original bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
nl3333.pdf
Size:
139.35 KB
Format:
Adobe Portable Document Format
Description:
Download

License bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description:
Download

Collections

Articles Électroniques