Caractérisation du silicium en couche mince déposé le silicium poreux par la technique de pulvérisation DC magnétron

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dc.contributor.authorZougar, Lyes
dc.date.accessioned2015-12-14T09:36:09Z
dc.date.available2015-12-14T09:36:09Z
dc.date.issued2010
dc.description98 p. : ill. ; 30 cm. (+ CD-Rom)fr_FR
dc.identifier.urihttp://hdl.handle.net/123456789/4290
dc.language.isofrfr_FR
dc.subjectSilicium poreuxfr_FR
dc.subjectCouches mincesfr_FR
dc.subjectMagnétronsfr_FR
dc.subjectSemiconducteurs amorphesfr_FR
dc.titleCaractérisation du silicium en couche mince déposé le silicium poreux par la technique de pulvérisation DC magnétronfr_FR
dc.typeThesisfr_FR

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