Électronique et Électrotechnique
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Item Comments on Researcher Bias : The Use of Machine Learning in Software Defect Prediction(Institute of electrical and electronics engineers, 2016) Tantithamthavorn, Chakkrit; McIntosh, Shane; Hassan, Ahmed E.; Matsumoto, KenichiItem Developer Micro Interaction Metrics for Software Defect Prediction(Institute of electrical and electronics engineers, 2016) Lee, Taek; Nam, Jaechang; Han, Donggyun; Kim, Sunghun; In, Hoh PeterItem Are Slice-Based Cohesion Metrics Actually Useful in Effort-Aware Post-Release Fault-Proneness Prediction? : An Empirical Study(Institute of electrical and electronics engineers, 2015) Yang, Yibiao; Zhou, Yuming; Lu, Hongmin; Chen, Lin; Chen, ZhenyuItem A Second Replicated Quantitative Analysis of Fault Distributions in Complex Software Systems(Institute of electrical and electronics engineers, 2013) Grbac, Tihana Galinac; Runeson, Per; Huljenic, DarkoItem Facilitating Coordination between Software Developers : A Study and Techniques for Timely and Efficient Recommendations(Institute of electrical and electronics engineers, 2015) Blincoe, Kelly; Valetto, Giuseppe; Damian, Daniela